Published February 2004
| Version v1
Journal article
Nanocrystals manufacturing by ultra-low-energy ion-beam-synthesis for non-volatile memory applications
Description
An overview of recent developments regarding the fabrication and structure of thin silicon dioxide films with embedded nanocrystals through ultra-low-energy ion-beam-synthesis (ULE-IBS) is presented. Advances in fabrication, increased understanding of structure formation processes and ways to control them allow for the fabrication of reproducible and attractive silicon-nanocrystal memory devices for a wide-range of memory applications as herein demonstrated in the case of low-voltage EEPROM-like applications
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2003.11.039;
- PII
- S0168583X03021517;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 216
- Journal Issue
- 2-3
- Journal Page Range
- p. 228-238
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- E-MRS 2003 Symposium E on ion beams for nanoscale surface modifications
- Dates
- 10-13 Jun 2003
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Mexico
- INIS RN
- 35059699
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CRYSTALS; DIAGRAMS; EXPERIMENTAL DATA; FABRICATION; IMAGES; ION BEAMS; ION IMPLANTATION; MEMORY DEVICES; NANOSTRUCTURES; SILICON OXIDES; SYNTHESIS; THIN FILMS
- Descriptors DEC
- BEAMS; CHALCOGENIDES; DATA; FILMS; INFORMATION; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.