Published February 2004 | Version v1
Journal article

Nanocrystals manufacturing by ultra-low-energy ion-beam-synthesis for non-volatile memory applications

Description

An overview of recent developments regarding the fabrication and structure of thin silicon dioxide films with embedded nanocrystals through ultra-low-energy ion-beam-synthesis (ULE-IBS) is presented. Advances in fabrication, increased understanding of structure formation processes and ways to control them allow for the fabrication of reproducible and attractive silicon-nanocrystal memory devices for a wide-range of memory applications as herein demonstrated in the case of low-voltage EEPROM-like applications

Additional details

Identifiers

DOI
10.1016/j.nimb.2003.11.039;
PII
S0168583X03021517;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
216
Journal Issue
2-3
Journal Page Range
p. 228-238
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
E-MRS 2003 Symposium E on ion beams for nanoscale surface modifications
Dates
10-13 Jun 2003
Place
Strasbourg (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
Mexico
INIS RN
35059699
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
CRYSTALS; DIAGRAMS; EXPERIMENTAL DATA; FABRICATION; IMAGES; ION BEAMS; ION IMPLANTATION; MEMORY DEVICES; NANOSTRUCTURES; SILICON OXIDES; SYNTHESIS; THIN FILMS
Descriptors DEC
BEAMS; CHALCOGENIDES; DATA; FILMS; INFORMATION; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.