Published January 2016 | Version v1
Journal article

Absolute distance measurement in a combined-dispersive interferometer using a femtosecond pulse laser

  • 1. State Key Laboratory of Precision Measurement Technology and Instruments, Tianjin University, Tianjin 300072 (China)
  • 2. National Institute of Metrology, China, Beijing 100013 (China)
  • 3. Key Laboratory of Opto-electronics Information Technology of Ministry of Education, Tianjin University, Tianjin 300072 (China)

Description

In this paper, a ranging system using dispersive interferometry is developed with a femtosecond pulse laser, aiming to eliminate the measurement dead zones by using a greatly unbalanced Mach–Zehnder interferometer. The distance can be measured by the frequency of the spectral modulation. We indicate that the integer number of the pulse-to-pulse length can be determined by changing the repetition frequency. In the short distance measurement, the results show an agreement within 1.5 μm compared with an incremental He-Ne laser in the 1 m measurement range. We do large-scale experiments on a long optical rail using a typical Michelson interferometer, and an agreement well within 25 μm is obtained in a range up to 75 m, corresponding to a relative precision of 3.3  ×  10−7. Additionally, we experimentally optimize the system set-up to minimize the measurement uncertainty. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/27/1/015202

Additional details

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
27
Journal Issue
1
Journal Page Range
[12 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47078564
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCURACY; COMPARATIVE EVALUATIONS; DISTANCE; HELIUM-NEON LASERS; INTERFEROMETRY; LENGTH; MICHELSON INTERFEROMETER; MODULATION; PULSES; REMOTE HANDLING
Descriptors DEC
DIMENSIONS; EVALUATION; GAS LASERS; INTERFEROMETERS; LASERS; MEASURING INSTRUMENTS