Transmission electron microscopy and electrical transport investigations performed on the same single-walled carbon nanotube

Electrical transport measurements and high resolution transmission electron microscopy performed on the same (rope of) single-walled carbon nanotube(s) (SWCNTs) allow to establish links between structural and electronic properties of the tubes. The tubes are deposited on electron transparent ultrathin Si3N4-membranes bearing Cr/AuPd-electrodes defined by electron beam lithography. TEM-micrographs of the setup reveal mostly ropes consisting of 2-3 tubes which also appear on a scanning force microscope image of the same area. A current-voltage trace of the ropes at 4.2 K is also presented