Published 1980 | Version v1
Journal article Metadata-only

Are soft errors caused by α-particles a problem

Creators

  • 1. ITT Semiconductors, Footscray (Australia)

Description

Soft errors are spontaneous non-reproducible errors in the operation of dynamic semiconductor storage devices. They are caused by the emission of uranium and thorium α-particles from impurities in the walls of the casing. (orig.)

Abstract (German)

Soft Errors sind spontane, nicht wiederholbar auftretende Fehler beim Betrieb von dynamischen Halbleiterspeichern. Sie werden durch die Emission von α-Teilchen aus Uran und Thorium in Verunreinigungen des Gehaeusematerials verursacht. (orig.)

Additional details

Additional titles

Original title (German)
Sind Soft Errors durch α-Teilchen ein Problem

Publishing Information

Journal Title
Elektronik (Muenchen)
Journal Issue
no.22
Series
Elektronik (Muenchen).
ISSN
0013-5658

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
12614258
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
BUILDING MATERIALS; ERRORS; NATURAL RADIOACTIVITY; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR STORAGE DEVICES; SIMULATION; THORIUM; URANIUM
Descriptors DEC
ACTINIDES; ELEMENTS; MEMORY DEVICES; METALS; RADIATION EFFECTS; RADIOACTIVITY; SEMICONDUCTOR DEVICES