Efficiency improvement of multicrystalline silicon solar cells after surface and grain boundaries passivation using vanadium oxide
Creators
- 1. Photovoltaïc Laboratory, Research and Technology Center of Energy, Technopôle de Borj-Cédria, BP 95, Hammam-Lif 2050 (Tunisia)
Description
Highlights: ► Evaporation of vanadium pentoxide onto the front surface leads to reduce the surface reflectivity considerably. ► An efficient surface passivation can be obtained after thermal treatment of obtained films. ► Efficiency of the obtained solar cells has been improved noticeably after thermal treatment of deposited thin films. - Abstract: The aim of this work is to investigate the effect of vanadium oxide deposition onto the front surface of multicrystalline silicon (mc-Si) substrat, without any additional cost in the fabrication process and leading to an efficient surface and grain boundaries (GBs) passivation that have not been reported before. The lowest reflectance of mc-Si coated with vanadium oxide film of 9% was achieved by annealing the deposited film at 600 °C. Vanadium pentoxide (V2O5) were thermally evaporated onto the surface of mc-Si substrates, followed by a short annealing duration at a temperature ranging between 600 °C and 800 °C, under O2 atmosphere. The chemical composition of the films was analyzed by means of Fourier transform infrared spectroscopy (FTIR). Surface and cross-section morphology were determined by atomic force microscope (AFM) and a scanning electron microscope (SEM), respectively. The deposited vanadium oxide thin films make the possibility of combining in one processing step an antireflection coating deposition along with efficient surface state passivation, as compared to a reference wafer. Silicon solar cells based on untreated and treated mc-Si wafers were achieved. We showed that mc-silicon solar cells, subjected to the above treatment, have better short circuit currents and open-circuit voltages than those made from untreated wafers. Thus, the efficiency of obtained solar cells has been improved.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.mseb.2012.05.002Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2012.05.002;
- PII
- S0921-5107(12)00303-0;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 177
- Journal Issue
- 13
- Journal Page Range
- p. 1003-1008
- ISSN
- 0921-5107
- CODEN
- MSBTEK
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44109988
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; CROSS SECTIONS; DEPOSITION; ELECTRICAL FAULTS; EVAPORATION; FABRICATION; FOURIER TRANSFORM SPECTROMETERS; GRAIN BOUNDARIES; INFRARED SPECTRA; MORPHOLOGY; PASSIVATION; REFLECTIVITY; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON SOLAR CELLS; SURFACES; TEMPERATURE RANGE 1000-4000 K; THIN FILMS; VANADIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; DIRECT ENERGY CONVERTERS; ELECTRON MICROSCOPY; ELEMENTS; EQUIPMENT; FILMS; HEAT TREATMENTS; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; PHYSICAL PROPERTIES; SEMIMETALS; SOLAR CELLS; SOLAR EQUIPMENT; SPECTRA; SPECTROMETERS; SURFACE PROPERTIES; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.