Study of passive films formed on mild steel in alkaline media by the application of anodic potentials
- 1. Universidade de Vigo, E.T.S.E.I., Campus Universitario, 36310 Vigo (Spain)
- 2. ICEMS - Instituto Superior Tecnico, Universidade Tecnica de Lisboa, Av. Rovisco Pais, 1049 - 001 Lisboa (Portugal)
- 3. EST Setubal, DEM, Instituto Politecnico de Setubal, Campus IPS, 2910 Setubal (Portugal)
Description
In this paper, iron oxide thin layers formed on mild steel substrates in alkaline media by the application of different anodic potentials were studied in order to characterize their morphology, composition and electrochemical behaviour, in particular under conditions of cathodic protection. The surface composition was evaluated by X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES). The morphology of the surface oxides was studied via Atomic Force Microscopy (AFM). The electrochemical behaviour of the surface oxides was studied using Electrochemical Impedance Spectroscopy (EIS). The results showed that the surface film is composed by Fe2+oxides and Fe3+ oxides and/or hydroxides. The contribution of Fe2+ species vanishes when the potential of film formation increases in the passive domain. Two distinct phases were differentiated in the outer layers of the surface film, which proves that film growing is topotactic in nature
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2008.11.012Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2008.11.012;
- PII
- S0254-0584(08)00898-5;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 114
- Journal Issue
- 2-3
- Journal Page Range
- p. 962-972
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40067051
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CATHODIC PROTECTION; ELECTROCHEMISTRY; IMPEDANCE; IRON IONS; IRON OXIDES; LAYERS; MORPHOLOGY; PASSIVITY; STEELS; SURFACES; THIN FILMS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; CHALCOGENIDES; CHARGED PARTICLES; CHEMISTRY; CORROSION PROTECTION; ELECTRON SPECTROSCOPY; FILMS; IONS; IRON ALLOYS; IRON BASE ALLOYS; IRON COMPOUNDS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.