Published November 1974
| Version v1
Journal article
An improved electron impact ion source power supply
Description
An electron impact ion source power supply has been developed that offers improved ion beam stability. The electrical adjustments of ion source parameters are more flexible, and safety features are incorporated to protect the electron emitting filament from accidental destruction. (author)
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of the Mass Spectrometry Society of Japan
- Journal Volume
- 22
- Journal Issue
- 3
- Series
- Shisutemu To Seigyo.
- Journal Page Range
- 203-207
- ISSN
- 1884-3271
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 7225678
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ION BEAMS; ION SOURCES; MASS SPECTROMETERS; POWER SUPPLIES; STABILITY
- Descriptors DEC
- BEAMS; ELECTRONIC EQUIPMENT; MEASURING INSTRUMENTS; SPECTROMETERS
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent