Published 1990
| Version v1
Book
Study of in-situ laser-deposition of superconducting thin films by in-situ resistance measurement
Creators
- 1. State Univ. of New York at Buffalo, Inst. on Superconductivity, Amherst, NY (United States)
Description
This paper reports the electric resistance measured in real time during laser evaporation deposition of superconducting thin films. It was found that different substrates led to different behaviors in the temporal change of the resistance. The results are consistent with the process of nucleation, interface reaction and bulk-like growth. Structural transformation was also observed due to oxygen backfilling at the final stage of the deposition
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (United States)
- ISBN
- 1-55899-057-7
- Imprint Title
- High-temperature superconductors: Fundamental properties and novel materials processing
- Imprint Pagination
- 1322 p.
- Journal Page Range
- p. 489-495.
Conference
- Title
- Materials Research Society fall meeting.
- Dates
- 27 Nov - 2 Dec 1989.
- Place
- Boston, MA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23021137
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHEMICAL COMPOSITION; CHEMICAL REACTION KINETICS; ELECTRIC IMPEDANCE; IN-SITU PROCESSING; INTERFACES; LASER-PRODUCED PLASMA; NUCLEATION; ORDER-DISORDER TRANSFORMATIONS; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY
- Descriptors DEC
- ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; FILMS; IMPEDANCE; KINETICS; ORE PROCESSING; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; PLASMA; REACTION KINETICS
Optional Information
- Secondary number(s)
- CONF-891119--.