Published December 10, 1991 | Version v1
Journal article

The practical use and application of Monte-Carlo studies in physical vapour deposition technology

Creators

  • 1. Dr. Elsing Engineering, Aachen (Germany)

Description

Most of the theory of physical vapour deposition processes has been well researched. There has, however, been little attempt to exploit the theoretical results of this research for practical development of these technologies. This paper develops a computer model for the magnetron sputter ion plating process, in which known physical laws are combined with geometry models of the kind used in computer-aided design technology. The model enables deposition rates and incidence angle distributions to be described for any desired substrate geometry and configuration, taking into account the dominant process parameters. Deposition rates and incidence angle distributions are computed for various film materials and process parameters and are compared with measured values, indicating excellent agreement. A final example shows the dependence of film thickness distribution at the bottom of a slot on a notched component on the geometrical nature of the workpiece itself and on its positioning in the process space. (orig.)

Additional details

Publishing Information

Journal Title
Surface and Coatings Technology
Journal Volume
49
Journal Issue
1-3
Series
Surf. Coat. Technol.
Journal Page Range
132-138
ISSN
0257-8972
CODEN
SCTEE

Conference

Title
18. international conference on metallurgical coatings and thin films.
Dates
22-26 Apr 1991.
Place
San Diego, CA (United States).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Switzerland
INIS RN
23069848
Subject category
S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANGULAR DISTRIBUTION; COMPUTERIZED SIMULATION; DEPOSITION; DESIGN; INCIDENCE ANGLE; ION SOURCES; MAGNETRONS; MATHEMATICAL MODELS; MONTE CARLO METHOD; SPUTTERING; THICKNESS; THIN FILMS
Descriptors DEC
CALCULATION METHODS; DIMENSIONS; DISTRIBUTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; SIMULATION