Critical conditions for atomic resolution imaging of molecular crystals by aberration-corrected HRTEM
- 1. Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-ku, Nagoya 456-8587 (Japan)
- 2. Electron Microscopy Group of Materials Science, University of Ulm, Albert-Einstein-Allee 11, D-89081 Ulm (Germany)
- 3. Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011 (Japan)
Description
Atomically resolved imaging of organic molecules consisting of thin crystals by aberration-corrected (AC) HRTEM was studied by experimental observations and image simulations. An atomically resolved image of the hexadecachlorophthalocyanatocopper (CuPcCl16) molecule was obtained under low-dose conditions. The conditions for imaging organic frameworks were found to be more restricted than those for heavier elements such as copper and chlorine. For the characterization of the benzene rings within CuPcCl16 molecules, the specimen thickness had to be less than ~5 nm. The effects of the defocus conditions were examined by changing the image according to the location of the inclined specimen. The optimal defocus range for atomic resolution imaging of organic molecules was limited to a narrow region around the Scherzer defocus. Compared with scanning transmission microscopy, AC-HRTEM is more suitable for low-dose imaging, but the optimum conditions were severely restricted. - Highlights: • An epitaxially grown CuPcCl16 thin film was observed by aberration-corrected HRTEM. • Latitude of defocus in direct imaging of organic molecule was very small. • The specimen thickness needed to be below ~5 nm for atomic imaging of molecules.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2015.08.006Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2015.08.006;
- PII
- S0304-3991(15)30021-8;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 159
- Journal Issue
- Part 1
- Journal Page Range
- p. 73-80
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48018098
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DOSES; EPITAXY; IMAGES; MOLECULAR CRYSTALS; MOLECULES; RESOLUTION; SIMULATION; THICKNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VISIBLE RADIATION
- Descriptors DEC
- CRYSTAL GROWTH METHODS; CRYSTALS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FILMS; MICROSCOPY; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.