Published 2009
| Version v1
Journal article
Influence of alumina on the passive oxidation at low oxygen pressure of hot-pressed α-SiC
- 1. PROMES CNRS, UPR 8521, F-66120 Font Romeu, (France)
- 2. SPCTS CNRS, UMR 6638, F-87060 Limoges, (France)
- 3. CEA Cadarache, DEN DEC SPUA LTEC, F-13108 St Paul Les Durance, (France)
Description
The influence of an alumina content (2 wt.%) on the oxidation behavior of hot-pressed α-SiC is studied. Sintering of α-SiC powder with alumina rests on the formation of a liquid phase corresponding to the eutectic composition in the SiO2-Al2O3 system. The oxidation kinetics of pure α-SiC at 1470 K under helium with an oxygen partial pressure of 0.1 Pa is linear, although silica is produced. The formation of Al-rich crystallized phase could be responsible for the slower oxidation kinetics of alumina-doped SiC. (authors)
Availability note (English)
Available from doi: http://dx.doi.org/10.1016/j.scriptamat.2008.11.013Additional details
Identifiers
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 60
- Journal Issue
- no.7
- Journal Page Range
- p. 481-484
- ISSN
- 1359-6462
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- France
- INIS RN
- 43021926
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; ATOMIC FORCE MICROSCOPY; CHEMICAL REACTION KINETICS; CRYSTALLIZATION; HEAT TREATMENTS; HOT PRESSING; MULLITE; OXIDATION; ROUGHNESS; SHRINKAGE; SILICON CARBIDES; SINTERING; THERMAL GRAVIMETRIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CARBIDES; CARBON COMPOUNDS; CHALCOGENIDES; CHEMICAL ANALYSIS; CHEMICAL REACTIONS; ELECTRON MICROSCOPY; FABRICATION; GRAVIMETRIC ANALYSIS; INORGANIC ION EXCHANGERS; ION EXCHANGE MATERIALS; KINETICS; MATERIALS; MATERIALS WORKING; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PRESSING; QUANTITATIVE CHEMICAL ANALYSIS; REACTION KINETICS; SILICON COMPOUNDS; SURFACE PROPERTIES; THERMAL ANALYSIS
Optional Information
- Notes
- 31 refs.