Annealing effect of particle size distribution and giant magnetoresistance in insulating granular films
- 1. Inorganic Chemistry Examination Team, Korean Intellectual Property Office, Daejeon, 302-701 (Korea, Republic of)
- 2. Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701 (Korea, Republic of)
- 3. Department of Advanced Materials Engineering, Korea Polytechnic University, Siheung 429-793 (Korea, Republic of)
- 4. Research Institute of Industrial Science and Technology (RIST), Pohang 790-330 (Korea, Republic of)
Description
We have investigated the relationship between the microstructural change and giant magnetoresistance of insulating Co-Al-O granular films as a function of the annealing time. The temperature dependence of electrical resistivity (ρ) showed the tunneling behavior for all the annealed samples. The magnetoresistance (MR) decreased largely with increasing annealing time, although the size of Co granules estimated from transmission electron microscopy (TEM) observation showed a small change. The comparison between the granule size estimated from the magnetization curves and the TEM observation has made it possible to distinguish between the geometrical size and the magnetic size of the granules. Parameter fits of magnetization curves to the Langevin function suggest that large clusters consisting of several small, ferromagnetically-coupled Co granules result from the decrease of MR on annealing
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2006.05.017;
- PII
- S0040-6090(06)00655-9;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 515
- Journal Issue
- 4
- Journal Page Range
- p. 2562-2566
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38058242
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM; ALUMINIUM COMPOUNDS; ANNEALING; COBALT; COBALT COMPOUNDS; FILMS; MAGNETIZATION; MAGNETORESISTANCE; OXIDES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CHALCOGENIDES; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; HEAT TREATMENTS; METALS; MICROSCOPY; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.