Depth profiling and photometric characteristics of Pr3+ doped BaMoO4 thin phosphor films grown using (266 nm Nd-YAG laser) pulsed laser deposition

Pr³⁺ doped BaMoO₄ nano thin films have been deposited by pulsed laser deposition on a glass substrate using a Nd-YAG laser (λ = 266 nm). The thin phosphor films were deposited in an ultra-high vacuum at a substrate temperature of 400 °C at different oxygen partial pressures. The crystal structure, surface morphology, film thickness and composition were examined by X-ray diffraction patterns, scanning electron microscope and energy-dispersive X-ray spectroscopy, respectively. The binding energy of the core levels, chemical state, atomic fractions, depth profiling of the thin film were investigated by X-ray photo-electron spectroscopy. The photoluminescence excitation, emission spectra and energy transfer process involved in Pr³⁺ doped BaMoO₄ thin films were analyzed. The color chromaticity co-ordinates, fluorescence decay time and the photometric properties of the as-deposited thin phosphor films were examined.