Structural analysis of bioceramic materials for denture application
- 1. Dept of Physics, FMIPA-Univ. Hasanuddin Makassar Indonesia (Indonesia)
Description
Structural analysis has been performed on bioceramic materials for denture application by using X-ray diffraction (XRD), X-ray fluorescence (XRF), and Scanning Electron Microscopy (SEM). XRF is using for analysis chemical composition of raw materials. XRF shows the ratio 1 : 1 : 1 : 1 between feldspar, quartz, kaolin and eggshell, respectively, resulting composition CaO content of 56.78 %, which is similar with natural tooth. Sample preparation was carried out on temperature of 800 °C, 900 °C and 1000 °C. X-ray diffraction result showed that the structure is crystalline with trigonal crystal system for SiO2 (a=b=4.9134 Å and c=5.4051 Å) and CaH2O2 (a=b=3.5925 Å and c=4.9082 Å). Based on the Scherrer's equation showed the crystallite size of the highest peak (SiO2) increase with increasing the temperature preparation. The highest hardness value (87 kg/mm2) and match with the standards of dentin hardness. The surface structure was observed by using SEM also discussed.
Additional details
Identifiers
- DOI
- 10.1063/1.4943725;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1719
- Journal Issue
- 1
- Journal Page Range
- p. 030030-030030.5
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 4. international conference on theoretical and applied physics (ICTAP) 2014
- Dates
- 16-17 Oct 2014
- Place
- Bali (Indonesia)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48035428
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALCIUM OXIDES; CHEMICAL COMPOSITION; DENTIN; FELDSPARS; HARDNESS; KAOLIN; LATTICE PARAMETERS; QUARTZ; RAW MATERIALS; SAMPLE PREPARATION; SCANNING ELECTRON MICROSCOPY; SILICON OXIDES; SURFACES; TEMPERATURE DEPENDENCE; TRIGONAL LATTICES; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CALCIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL ANALYSIS; CLAYS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; MATERIALS; MECHANICAL PROPERTIES; MICROSCOPY; MINERALS; NONDESTRUCTIVE ANALYSIS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SILICATE MINERALS; SILICON COMPOUNDS; THREE-DIMENSIONAL LATTICES; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- (c) 2016 AIP Publishing LLC