Published June 2, 2000
| Version v1
Journal article
HTS SQUID application for measuring the magnetic properties of AISI type 316L(N) steel
Creators
Description
A portable RF HTS SQUID-based susceptometer was used for small-size magnetized sample testing in weak DC (up to 200 A/m) and AC (up to 4 A/m) magnetic fields. The system resolution for the magnetic moment is of the order of 1.6x10-10 A m2. The measured DC susceptibility of a tested sample of Gd88La12 agrees well with the value obtained by using a commercial liquid helium susceptometer. The measured volume susceptibility of AISI type 316L(N) steel increases after fatigue due to the microcrack induced by cyclic stress
Additional details
Identifiers
- PII
- S0304885300002882;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 215-216
- Journal Issue
- 3
- Journal Page Range
- p. 785-787
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34035128
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRACKS; FATIGUE; GADOLINIUM COMPOUNDS; LANTHANUM COMPOUNDS; MAGNETIC MOMENTS; MAGNETIC PROPERTIES; MAGNETIC SUSCEPTIBILITY; MEASURING METHODS; RESOLUTION; SQUID DEVICES; STAINLESS STEEL-316L; STRESSES
- Descriptors DEC
- ALLOYS; AUSTENITIC STEELS; CARBON ADDITIONS; CHROMIUM ALLOYS; CHROMIUM STEELS; CHROMIUM-MOLYBDENUM STEELS; CHROMIUM-NICKEL STEELS; CHROMIUM-NICKEL-MOLYBDENUM STEELS; CORROSION RESISTANT ALLOYS; ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; HEAT RESISTANT MATERIALS; HEAT RESISTING ALLOYS; HIGH ALLOY STEELS; IRON ALLOYS; IRON BASE ALLOYS; LOW CARBON-HIGH ALLOY STEELS; MAGNETIC PROPERTIES; MATERIALS; MEASURING INSTRUMENTS; MECHANICAL PROPERTIES; MICROWAVE EQUIPMENT; MOLYBDENUM ALLOYS; NICKEL ALLOYS; PHYSICAL PROPERTIES; RARE EARTH COMPOUNDS; STAINLESS STEELS; STEEL-CR17NI12MO3-L; STEELS; SUPERCONDUCTING DEVICES; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.