Published March 31, 2009 | Version v1
Journal article

Depinning transition of a dislocation line in ferritic oxide strengthened steels

  • 1. Paul Scherrer Institute, 5232 Villigen PSI (Switzerland)
  • 2. Centre for Materials Science and Engineering, University of Edinburgh, Edinburgh EH9 3JL (United Kingdom)
  • 3. IZBS University of Karlsruhe, Kaiserstrasse 12, 76131 Karlsruhe (Germany)

Description

The dynamics of an edge dislocation in a medium with random oxide dispersoid particles acting as pinning centres is analysed. The dislocation line undergoes a depinning transition, where the order parameter is the dislocation line velocity v, which increases from zero for driving external resolved shear stresses τ beyond to a threshold value τc, known as the critical resolved shear stress. The critical stress is obtained by means of statistical analysis of the motion of a single dislocation in its glide plane, using overdamped, discrete dislocation dynamics simulations

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jnucmat.2008.12.003

Additional details

Identifiers

DOI
10.1016/j.jnucmat.2008.12.003;
PII
S0022-3115(08)00726-5;

Publishing Information

Journal Title
Journal of Nuclear Materials
Journal Volume
385
Journal Issue
2
Journal Page Range
p. 284-287
ISSN
0022-3115
CODEN
JNUMAM

Conference

Title
3. symposium N on nuclear materials
Acronym
E-MRS 2008 spring meeting
Dates
26-30 May 2008
Place
Strasbourg (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40050216
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
EDGE DISLOCATIONS; FERRITIC STEELS; ORDER PARAMETERS; OXIDES; SHEAR; SIMULATION; STRESSES
Descriptors DEC
ALLOYS; CARBON ADDITIONS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIMENSIONLESS NUMBERS; DISLOCATIONS; IRON ALLOYS; IRON BASE ALLOYS; LINE DEFECTS; OXYGEN COMPOUNDS; STEELS; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.