Texture coefficient analysis of ion beam irradiated copper nanowires

Radiation may deteriorate physical properties of the materials and leave negative as well as positive impacts especially on crystalline materials. The energy deposited by ions to the grains and grain boundaries could also influence other properties of grains like: strain, reflection of charge carriers from grain boundaries, in addition to their grain size and orientation. The intensity of a peak in the XRD spectra is the direct reflection of orientation of a miller plane in the crystal. The increased intensity symbolizes the crystalline behavior due to defects annealing, while decreased intensity portray the defects formation and slender amorphisation. Orientation distribution function is a probability distribution function that quantified the texture of a polycrystalline material. The coefficients of harmonic expansion of orientation distribution function is the measurement of the texture coefficient 'TC'. This study focused on the investigation of effect of ion beam irradiation on the preffered orientation of the planes of copper nanowires.