Radiation damage in the diamond based beam condition monitors of the CMS experiment at the Large Hadron Collider (LHC) at CERN
Creators
- 1. Institut für Experimentelle Kernphysik, Karlsruhe Institute of Technology, Campus Süd, P.O. Box 6980, 76128 Karlsruhe (Germany)
- 2. CERN, 1211 Genève 23 (Switzerland)
- 3. NC PHEP BSU, Minsk (Belarus)
- 4. DESY, Platanenallee 6, 15738 Zeuthen (Germany)
- 5. Brandenburgische Technische Universität, Postfach 101344, 03013 Cottbus (Germany)
- 6. Princeton University, Princeton, NJ 08544-0708 (United States)
Description
The Beam Condition Monitor (BCM) of the CMS detector at the LHC is a protection device similar to the LHC Beam Loss Monitor system. While the electronics used is the same, poly-crystalline Chemical Vapor Deposition (pCVD) diamonds are used instead of ionization chambers as the BCM sensor material. The main purpose of the system is the protection of the silicon Pixel and Strip tracking detectors by inducing a beam dump, if the beam losses are too high in the CMS detector. By comparing the detector current with the instantaneous luminosity, the BCM detector efficiency can be monitored. The number of radiation-induced defects in the diamond, reduces the charge collection distance, and hence lowers the signal. The number of these induced defects can be simulated using the FLUKA Monte Carlo simulation. The cross-section for creating defects increases with decreasing energies of the impinging particles. This explains, why diamond sensors mounted close to heavy calorimeters experience more radiation damage, because of the high number of low energy neutrons in these regions. The signal decrease was stronger than expected from the number of simulated defects. Here polarization from trapped charge carriers in the defects is a likely candidate for explaining the difference, as suggested by Transient Current Technique (TCT) measurements. A single-crystalline (sCVD) diamond sensor shows a faster relative signal decrease than a pCVD sensor mounted at the same location. This is expected, since the relative increase in the number of defects is larger in sCVD than in pCVD sensors. -- Highlights: •The BCM system and its diamond detectors at the CMS experiment of the LHC are presented. •Detectors show a decreased signal strength with increasing integrated luminosity. •CCD measurements using constant HV and alternating HV to prevent polarization are compared. •TCT measurements show a decreasing signal when polarization builds up. •Polarization effects are a likely explanation for the strong observed signal decrease
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2013.05.041Additional details
Identifiers
- DOI
- 10.1016/j.nima.2013.05.041;
- PII
- S0168-9002(13)00628-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 730
- Journal Page Range
- p. 168-173
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 9. international conference on radiation effects on semiconductor materials detectors and devices
- Dates
- 9-12 Oct 2012
- Place
- Florence (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45051510
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM MONITORS; CERN LHC; CHARGE CARRIERS; CHARGE COLLECTION; CHEMICAL VAPOR DEPOSITION; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; DIAMONDS; DIELECTRIC TRACK DETECTORS; EFFICIENCY; F CODES; MONOCRYSTALS; MONTE CARLO METHOD; MULTIPARTICLE SPECTROMETERS; PARTICLE IDENTIFICATION; POLARIZATION; RADIATION EFFECTS; SENSORS; SHOWER COUNTERS
- Descriptors DEC
- ACCELERATORS; CALCULATION METHODS; CARBON; CHEMICAL COATING; COMPUTER CODES; CRYSTALS; CYCLIC ACCELERATORS; DEPOSITION; ELEMENTS; EVALUATION; MEASURING INSTRUMENTS; MINERALS; MONITORS; NONMETALS; RADIATION DETECTORS; SIMULATION; SPECTROMETERS; STORAGE RINGS; SURFACE COATING; SYNCHROTRONS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.