Published 1992
| Version v1
Book
YBa2Cu3Ox dc-SQUIDs on Y-ZrO2 bicrystals
Creators
- 1. Dept. of Physics, Chalmers Univ. of Tech., Goeteborg (Sweden)
- 2. Inst. of Crystallography, Academy of Sciences, Moscow (Russia)
Description
We have studied dc SQUIDs fabricated by laser deposition of YBa2Cu3Ox thin films on yttria stabilized zirconia bicrystal substrates. The SQUID properties were studied as a function of the misorientation angle θ between the two halves of the bicrystal. The best performance was obtained for θ=32deg. The modulation depth in the voltage-flux curve in this case was 12μV at 77 K. No hysteresis was observed when the direction of the magnetic field was reversed. (orig.)
Additional details
Publishing Information
- Publisher
- Springer.
- Imprint Place
- Berlin (Germany)
- ISBN
- 3-540-55396-7
- Imprint Title
- Superconducting devices and their applications. Proceedings
- Imprint Pagination
- 618 p.
- Journal Volume
- 64
- Series
- Springer proceedings in physics.
- Journal Page Range
- p. 142-145.
Conference
- Title
- Superconducting devices and their applications.
- Acronym
- 4. international conference on superconducting and quantum effect devices (SQUID-4)
- Dates
- 18-21 Jun 1991.
- Place
- Berlin (Germany).
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 24025586
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BARIUM OXIDES; COPPER OXIDES; CRITICAL CURRENT; FABRICATION; GRAIN BOUNDARIES; HIGH-TC SUPERCONDUCTORS; HYSTERESIS; JOSEPHSON JUNCTIONS; MAGNETIC FIELDS; MODULATION; NOISE; QUATERNARY COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SQUID DEVICES; SUBSTRATES; TEMPERATURE RANGE 0065-0273 K; THIN FILMS; YTTRIUM OXIDES; ZIRCONIUM OXIDES
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; AMINES; BARIUM COMPOUNDS; CHALCOGENIDES; COPPER COMPOUNDS; CRYSTAL STRUCTURE; CURRENTS; ELECTRIC CURRENTS; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; FLUXMETERS; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; MICROWAVE EQUIPMENT; ORGANIC COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; SEMICONDUCTOR JUNCTIONS; SUPERCONDUCTING DEVICES; SUPERCONDUCTORS; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS; ZIRCONIUM COMPOUNDS