Published January 12, 2004
| Version v1
Journal article
Sensitive measurements of electric field distributions in low-pressure Ar plasmas by laser-induced fluorescence-dip spectroscopy
Creators
- 1. Department of Electronics, Nagoya University, Nagoya 464-8603 (Japan)
Description
Laser-induced fluorescence-dip (LIF-dip) spectroscopy of Ar was used for measuring the distributions of sheath electric fields in low-pressure, inductively-coupled Ar plasmas. A sensitive detection limit of 3 V/cm obtained by LIF-dip allowed the measurement in the presheath region. The distributions of electric fields observed experimentally were compared with those of theoretical calculations based on a simple fluid model. As a result, reasonable agreement between the experiment and the theory was obtained in the electric fields in the sheath region, while the electric fields in the presheath region observed experimentally were higher than the theoretical results
Additional details
Identifiers
- DOI
- 10.1063/1.1639943;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 84
- Journal Issue
- 2
- Journal Page Range
- p. 185-187
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36027969
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ARGON; ELECTRIC FIELDS; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; LASERS; PLASMA; PLASMA DIAGNOSTICS; PLASMA SHEATH; PLASMA SIMULATION; SENSITIVITY; SPATIAL DISTRIBUTION
- Descriptors DEC
- DISTRIBUTION; ELEMENTS; EMISSION; EMISSION SPECTROSCOPY; FLUIDS; GASES; LUMINESCENCE; NONMETALS; PHOTON EMISSION; RARE GASES; SIMULATION; SPECTROSCOPY
Optional Information
- Notes
- (c) 2004 American Institute of Physics.