Published January 12, 2004 | Version v1
Journal article

Sensitive measurements of electric field distributions in low-pressure Ar plasmas by laser-induced fluorescence-dip spectroscopy

  • 1. Department of Electronics, Nagoya University, Nagoya 464-8603 (Japan)

Description

Laser-induced fluorescence-dip (LIF-dip) spectroscopy of Ar was used for measuring the distributions of sheath electric fields in low-pressure, inductively-coupled Ar plasmas. A sensitive detection limit of 3 V/cm obtained by LIF-dip allowed the measurement in the presheath region. The distributions of electric fields observed experimentally were compared with those of theoretical calculations based on a simple fluid model. As a result, reasonable agreement between the experiment and the theory was obtained in the electric fields in the sheath region, while the electric fields in the presheath region observed experimentally were higher than the theoretical results

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
84
Journal Issue
2
Journal Page Range
p. 185-187
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36027969
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Descriptors DEI
ARGON; ELECTRIC FIELDS; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; LASERS; PLASMA; PLASMA DIAGNOSTICS; PLASMA SHEATH; PLASMA SIMULATION; SENSITIVITY; SPATIAL DISTRIBUTION
Descriptors DEC
DISTRIBUTION; ELEMENTS; EMISSION; EMISSION SPECTROSCOPY; FLUIDS; GASES; LUMINESCENCE; NONMETALS; PHOTON EMISSION; RARE GASES; SIMULATION; SPECTROSCOPY

Optional Information

Notes
(c) 2004 American Institute of Physics.