X-ray energy dispersive spectroscopy of intergranular phases in βll sialons
Creators
- 1. Dept. of Materials Science and Mineral Eng. and the Materials and Molecular Research Division Lawrence Berkeley Lab., Univ. of California Berkeley, CA 94720
Description
The purpose of this chapter is to determine whether segregation of impurities or A1 partitioning is occurring, and whether these mechanisms can then be interpreted as a cause for the retention of noncrystalline intergranular phases in low A1 solid solution alloys. Uses x-ray energy dispersive spectroscopy in conjunction with scanning transmission electron microscopy to qualitatively and semi-quantitatively characterize retained noncrystalline phases in several compositions of sialons. Uses diffuse dark field imaging in conventional transmission mode to identify noncrystalline phases prior to x-ray microanalysis. Finds that partitioning of A1 and impurity atoms does not occur for these compositions except in isolated cases. Suggests that Fe impurities are readily incorporated into the matrix phase
Additional details
Publishing Information
- Publisher
- Plenum Publishing Corp.
- Imprint Place
- New York, NY (USA)
- Imprint Title
- Advances in materials characterization. Vol. 15
- Journal Page Range
- p. 339-350.
Conference
- Title
- 18. ceramic science conference on advances in materials characterization.
- Dates
- 16-18 Aug 1982.
- Place
- Alfred, NY (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 16005890
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM ALLOYS; ALUMINIUM OXIDES; IMPURITIES; IRON; MICROANALYSIS; PARTITION; PHASE STUDIES; SCANNING ELECTRON MICROSCOPY; SEGREGATION; SILICON NITRIDES; TRANSMISSION ELECTRON MICROSCO; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALLOYS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS; SPECTROSCOPY; TRANSITION ELEMENTS