(Ba, Sr) TiO3 ferroelectric thin films for tunable microwave applications
- 1. Naval Research Laboratory, 4555 Overlook Avenue SW, Washington DC 20375 (United States)
- 2. Department of Materials Science and Engineering, Penn State University, University Park, PA 16802 (United States)
Description
The dielectric properties of ferroelectric thin films were investigated for tunable microwave applications. We have observed that epitaxially grown Ba1-x Srx TiO3 (BST, 0.4 ≤ X ≤ 1 ) films are distorted from the normal cubic symmetry of the corresponding bulk at room temperature. This structural distortion caused by film strain has a strong impact on the microwave dielectric properties. For compressive strain, the dielectric constant and tuning were decreased and the films showed high dielectric Q. However for tensional strain, the opposite effect was observed. This observation has been interpreted based on phenomenological thermodynamics and strain-induced polarization physics. Two experimental examples, strain-relieved films and strain-enabled films, are presented to show how film strain affects the tunable microwave properties. (Author) 21 refs., 8 figs
Additional details
Publishing Information
- Journal Title
- Revista Mexicana de Fisica
- Journal Volume
- 50
- Journal Issue
- 5
- Journal Page Range
- p. 501-505
- ISSN
- 0035-001X
- CODEN
- RMXFAT
INIS
- Country of Publication
- Mexico
- Country of Input or Organization
- Mexico
- INIS RN
- 36022483
- Subject category
- S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; BARIUM; CAPACITANCE; CRYSTALS; DIAGRAMS; DIELECTRIC PROPERTIES; ELECTRIC FIELDS; EXPERIMENTAL DATA; FERROELECTRIC MATERIALS; IMAGES; MICROWAVE EQUIPMENT; SCANNING ELECTRON MICROSCOPY; STRONTIUM; STRONTIUM TITANATES; SUBSTRATES; TEMPERATURE DEPENDENCE; THIN FILMS; TITANIUM; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALKALINE EARTH METALS; COHERENT SCATTERING; DATA; DIELECTRIC MATERIALS; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; INFORMATION; MATERIALS; METALS; MICROSCOPY; NUMERICAL DATA; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; STRONTIUM COMPOUNDS; TITANATES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS