Published February 2017 | Version v1
Journal article

Advanced power analysis methodology targeted to the optimization of a digital pixel readout chip design and its critical serial powering system

  • 1. Department of Engineering, University of Perugia, Via G. Duranti 93, I-06125 Perugia (Italy)
  • 2. CERN, 1211 Geneva (Switzerland)
  • 3. Fachhochschule Dortmund, Sonnenstraße 96, 44139 Dortmund (Germany)
  • 4. Physikalisches Institut, Universität Bonn, Nußallee 12, 531 15 Bonn (Germany)

Description

A dedicated power analysis methodology, based on modern digital design tools and integrated with the VEPIX53 simulation framework developed within RD53 collaboration, is being used to guide vital choices for the design and optimization of the next generation ATLAS and CMS pixel chips and their critical serial powering circuit (shunt-LDO). Power consumption is studied at different stages of the design flow under different operating conditions. Significant effort is put into extensive investigations of dynamic power variations in relation with the decoupling seen by the powering network. Shunt-LDO simulations are also reported to prove the reliability at the system level.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/12/02/C02017

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
12
Journal Issue
02
Journal Page Range
p. C02017
ISSN
1748-0221

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49019998
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ATLAS DETECTOR; CMS DETECTOR; DECOUPLING; DIGITAL SYSTEMS; OPTIMIZATION; POWER SYSTEMS; READOUT SYSTEMS; RELIABILITY; SIMULATION
Descriptors DEC
ENERGY SYSTEMS; MEASURING INSTRUMENTS; RADIATION DETECTORS