Published 2004
| Version v1
Miscellaneous
Structural studies on ion implanted semiconductors using x-ray synchrotron radiation: strain evolution and growth of nanocrystals
- 1. Institute of ion Beam Physics and Materials Research, Forschungszentrum Rossendorf, Dresden (Germany)
- 2. Institute of Electronic Materials Technology, Warsaw (Poland)
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- Abstracts of 5. International Symposium Ion Implantation and Other Applications of Ions and Electrons, ION 2004
- Imprint Pagination
- 257 p.
- Journal Page Range
- p. 40
Conference
- Title
- 5. International Symposium Ion Implantation and Other Applications of Ions and Electrons, ION 2004
- Dates
- 14-17 Jun 2004
- Place
- Kazimierz Dolny (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 36060040
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- ARSENIC IONS; CRYSTAL STRUCTURE; DIAMONDS; DOSE RATES; DOSE-RESPONSE RELATIONSHIPS; FABRICATION; HETEROJUNCTIONS; INDIUM PHOSPHIDES; ION IMPLANTATION; NANOSTRUCTURES; OPTIMIZATION; PHYSICAL RADIATION EFFECTS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR MATERIALS; SILICON CARBIDES; STRAINS; SYNCHROTRON RADIATION; TEMPERATURE DEPENDENCE; X-RAY DIFFRACTION
- Descriptors DEC
- BREMSSTRAHLUNG; CARBIDES; CARBON; CARBON COMPOUNDS; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; INDIUM COMPOUNDS; IONS; MATERIALS; MINERALS; NONMETALS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; RADIATION EFFECTS; RADIATIONS; SCATTERING; SEMICONDUCTOR JUNCTIONS; SILICON COMPOUNDS; SPECTROSCOPY