Published 1993 | Version v1
Report Open

A search for strong-field direct two electron ionization using coincidence spectroscopy

  • 1. CEA Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France). Service de Recherches sur les Surfaces et de l'Irradiation de la Matiere
  • 2. Brookhaven National Lab., Upton, NY (United States)

Description

We report on our program in detecting two-electron ionization using electron-electron and electron-ion coincidence measurements. The coincidence techniques have been applied to the multiphoton ionization (MPI) of xenon atoms with 0.527 μm excitation. The results show that direct two electron ionization is not occurring which is in variance with an earlier report. We also present a polarization study on the MPI of helium at 0.62 μm and discuss these results in context of existing models

Availability note (English)

MF available from INIS under the Report Number; OSTI as DE93013435; NTIS; INIS; US Govt. Printing Office Dep.

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Additional details

Publishing Information

Imprint Pagination
5 p.
Report number
BNL--48940

Conference

Title
physics with intense laser pulses.
Acronym
5. short wavelength
Dates
29-31 Mar 1993.
Place
San Diego, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
24068292
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COINCIDENCE SPECTROMETRY; ELECTRON SPECTRA; HELIUM; MULTI-PHOTON PROCESSES; PHOTOIONIZATION; XENON
Descriptors DEC
COINCIDENCE METHODS; COUNTING TECHNIQUES; ELEMENTS; IONIZATION; NONMETALS; RARE GASES; SPECTRA