I(t), I(V) and surface effects studies of vapor grown and solution grown HgI2 detectors
Creators
- 1. CEA Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France). Div. LETI
Description
The experiments we have carried out during the last years show that solution grown HgI2 crystals exhibit a lower μτ product than vapor grown crystal, despite a crystalline perfection and a purity at least as high, or even higher. They also show different surface properties. From the current response I(t) following a voltage step, and from the I(V) characteristic analysis, we determine the trapping levels Et present in the sample and show the influence of the contact deposition technique and surface treatments on the electrical field gradient nearby the electrode. A nitric acid treatment increases the blocking effect of the cathode contact on solution grown crystal, and therefore improves their detection performance for low energy X-rays and gamma rays. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research, Section A
- Journal Volume
- 283
- Journal Issue
- 2
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. A.
- Journal Page Range
- 199-207
- ISSN
- 0168-9002
- CODEN
- NIMAE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 21011216
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CATHODES; CRYSTAL GROWTH; DEPOSITION; ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; ELECTRIC FIELDS; GAMMA DETECTION; HGI2 SEMICONDUCTOR DETECTORS; INHOMOGENEOUS FIELDS; MERCURY IODIDES; RESPONSE FUNCTIONS; SURFACES; TIME DEPENDENCE; TIMING PROPERTIES; TRAPPING; X-RAY DETECTION
- Descriptors DEC
- DETECTION; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTRODES; EQUIPMENT; FUNCTIONS; HALIDES; HALOGEN COMPOUNDS; IODIDES; IODINE COMPOUNDS; MEASURING INSTRUMENTS; MERCURY COMPOUNDS; MERCURY HALIDES; PHYSICAL PROPERTIES; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS