Published 1977
| Version v1
Book
IEEE test procedures for high-purity germanium detectors for ionizing radiation
Creators
Description
IEEE Std 325-1971 (Reaff 1977), Test Procedures for Germanium Gamma-Ray Detectors (ANSI N42.8-1972) (Reaff 1977), presents test procedures for germanium detectors for ionizing radiation. The germanium detectors that existed at the time of publication of IEEE Std 325-1971 (Reaff 1977) were made by the lithium drift process. Detectors made from high-purity germanium have since become available. This standard has therefore been prepared as a supplement to IEEE Std 325-1971 (Reaff 1977) to provide such additional test procedures as are required for high-purity germanium detectors
Additional details
Publishing Information
- Publisher
- The Institute of Electrical and Electronics Engineers, Inc.
- Imprint Place
- New York, NY
- Imprint Pagination
- 22 p.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 15003334
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; SPECIFICATIONS; TESTING
- Descriptors DEC
- MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS
Optional Information
- Secondary number(s)
- IEEE--645-1977.