Published January 1985 | Version v1
Journal article

Diagnostics in industrial equipment

  • 1. Varian Associates, Gloucester, MA (USA). Extrion Div.

Description

The use of computers in semiconductor industrial equipment has been primarily for process control. Increasing demand for easily maintainable equipment has forced a new diagnostic responsibility on the computer control systems. In a properly designed control system the diagnostic capability of the computers can allow service personnel to determine system faults to the board or chip level. The diagnostic capabilities of a control system are dependent on the system architecture and the software resource available. A comprehensive diagnostic program with emphasis on user friendliness and encompassing key areas such as automatic diagnostics on power up, board and chip level tests, subassembly functionality tests, troubleshooting instructions and guidance has been applied to the Varian/Extrion 120-10 ion implantation system. The impact of such diagnostic capability greatly reduces the mean time to repair of machine failures, therefore increasing productivity and reducing maintenance expenses. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res., Sect. B
Journal Volume
6
Journal Issue
1/2
Series
CODEN: NIMBE.;Nucl. Instrum. Methods Phys. Res., Sect. B.
Journal Page Range
154-159
ISSN
0168-583X

Conference

Title
5. international conference on ion implantation equipment and techniques.
Dates
23-27 Jul 1984.
Place
Jeffersonville, VT (USA).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
16054342
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
CALIBRATION; CONTROL SYSTEMS; DIAGNOSTIC TECHNIQUES; DISPLAY DEVICES; EQUIPMENT; EXPERIMENTAL DATA; ION IMPLANTATION
Descriptors DEC
COMPUTER-GRAPHICS DEVICES; DATA; INFORMATION; NUMERICAL DATA