Precision Measurements of the 278 keV 14N(p,γ) and the 151 keV 18O(p,α) Resonance Parameters

In thin film technology, analytical methods for monitoring the deposition of oxide and nitride coatings and the effects of corrosive, laser and ion-beam treatments have attracted considerable attention. For depth-profiling the concentrations of light isotopes, resonant nuclear reaction analysis is an excellent non-destructive ion-beam analytical tool. We report here on precision measurements of the 278 keV 14N(p,γ) and the 151 keV 18O(p,α) resonances using the high-resolution proton beam of the Goettingen IONAS accelerator. The deduced resonance energies ER and total widths Γ(in the laboratory system) are ER = 277.60(27) keV and Γ = 1115(33) eV for the 14N(p,γ) resonance, and ER = 150.97(26) keV and Γ = 178(35) eV for the 18O(p,α) resonance. These values are significantly more precise than the ones quoted in the literature.