Published December 2016
| Version v1
Book
Composition profile of thin film target by Rutherford backscattering spectrometry
Creators
- 1. Inter University Accelerator Centre, New Delhi (India)
- 2. Department of Physics, Panjab University, Chandigarh (India)
- 3. Department of Physics and Astrophysics, University of Delhi (India)
Description
Rutherford backscattering spectrometry (RBS) has been in regular use at IUAC as an ion beam based analytical technique for providing accurate information about the elemental composition near surface of the material. RBS gives pertinent information about composition profile of the target within a few micro meter depth from the surface. This technique is very useful not only for thin films but also for bulk samples. In this paper, the RBS analysis for a self-supported, carbon backed and caped nuclear target samples has been presented
Additional details
Publishing Information
- Publisher
- Bhabha Atomic Research Centre
- Imprint Place
- Mumbai (India)
- Imprint Title
- Proceedings of the DAE-BRNS symposium on nuclear physics. V. 61
- Imprint Pagination
- 1160 p.
- Journal Page Range
- p. 1038-1039
Conference
- Title
- 61. DAE-BRNS symposium on nuclear physics
- Dates
- 5-9 Dec 2016
- Place
- Kolkata (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 48040429
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- GONIOMETERS; LEAD 208 TARGET; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TANDEM ELECTROSTATIC ACCELERATORS; THIN FILMS
- Descriptors DEC
- ACCELERATORS; ELECTROSTATIC ACCELERATORS; FILMS; MEASURING INSTRUMENTS; SPECTROSCOPY; TARGETS
Optional Information
- Notes
- 5 refs., 1 fig., 1 tab.