Dewetting of Ni thin films obtained by atomic layer deposition due to the thermal reduction process: Variation of the thicknesses
Creators
- 1. Departamento de Física, Universidad de Santiago de Chile, 9170124 Santiago (Chile)
- 2. Center for the Development of Nanoscience and Nanotechnology, 9170124 Santiago (Chile)
Description
Nickel oxide thin films with different thicknesses were synthesized by atomic layer deposition. After a thermal reduction process, under a controlled atmosphere of hydrogen, it was possible to convert nickel oxide to metallic nickel. The different thicknesses were obtained for 250 to 2000 cycles of NiCp2/O3. The Ni thin films were characterized by X-ray diffraction, scanning electron microscopy, and by Magneto-Optical Kerr effect measurements. Micromagnetic simulations have been performed to investigate the mechanism of magnetization reversion of these films. Interestingly, the thermal reduction of films synthesized by ALD allows the generation of both randomly oriented, sized and spaced Ni islands and antidot arrays from thin films. - Highlights: • NiO films with different thicknesses were synthesized by atomic layer deposition. • After a thermal reduction process it was possible to convert NiO to metallic Ni. • Different thicknesses were obtained considering from 250 to 2000 cycles of NiCp2/O3. • The thermal reduction allows the generation of Ni nanoparticles and antidot arrays.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2017.07.041Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2017.07.041;
- PII
- S0040-6090(17)30535-7;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 638
- Journal Page Range
- p. 114-118
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49080708
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CONTROLLED ATMOSPHERES; DEPOSITION; KERR EFFECT; MAGNETIC PROPERTIES; NICKEL OXIDES; REDUCTION; SCANNING ELECTRON MICROSCOPY; SYNTHESIS; THICKNESS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ATMOSPHERES; CHALCOGENIDES; CHEMICAL REACTIONS; COHERENT SCATTERING; DIELECTRIC PROPERTIES; DIFFRACTION; DIMENSIONS; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; FILMS; MICROSCOPY; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.