Published October 1, 2016 | Version v1
Journal article

Application of the bond valence method in the non-isovalent semiconductor alloy (GaN)1−x(ZnO)x

Creators

  • 1. Department of Physics and Astronomy, Stony Brook University, Stony Brook, NY 11794-3800, US (United States)

Description

This paper studies the bond valence method (BVM) and its application in the non-isovalent semiconductor alloy (GaN)1−x(ZnO)x. Particular attention is paid to the role of short-range order (SRO). The theoretical standing of the BVM is examined by density-functional theory (DFT) calculations. Combining the BVM with Monte-Carlo simulations and a DFT-based cluster expansion model, bond-length distributions and bond-angle variations are predicted. The connection between bond valence and bond stiffness is also discussed. Finally the BVM is extended to the modelling of an interatomic potential. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0965-0393/24/7/075014

Additional details

Publishing Information

Journal Title
Modelling and Simulation in Materials Science and Engineering
Journal Volume
24
Journal Issue
7
Journal Page Range
[12 p.]
ISSN
0965-0393