Published March 2007
| Version v1
Journal article
Low-temperature muon spin relaxation measurements on CeRu4Sn6
- 1. Physics Department, University of Johannesburg, P.O. Box 524, Auckland Park 2006, Johannesburg (South Africa)
- 2. ISIS Facility, Rutherford Appleton Laboratory, CCLRC, Chilton, Oxfordshire (United Kingdom)
- 3. Institute of Solid State Physics, TU-Vienna (Austria)
- 4. Max-Planck Institute for Chemical Physics of Solids, Dresden (Germany)
Description
We report on the results of muon spin relaxation (μSR) measurements on the low-carrier-density, strongly correlated compound CeRu4Sn6. Our results dismiss the possibility of magnetic ordering in CeRu4Sn6, either in the form of spin-glass or long-range ordering for temperatures down to 50mK. The muon depolarization rate is both temperature- and field-dependent at low temperatures (T<1K), consistent with the physical properties of CeRu4Sn6, indicating that it is a paramagnetic material with low-temperature quantum fluctuations
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2006.10.084;
- PII
- S0304-8853(06)01245-5;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 310
- Journal Issue
- 2
- Journal Page Range
- p. 377-379
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- 17. international conference on magnetism
- Dates
- 20-25 Aug 2006
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39022254
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARRIER DENSITY; CERIUM ALLOYS; DEPOLARIZATION; FLUCTUATIONS; MAGNETIZATION; MUON SPIN RELAXATION; PARAMAGNETISM; PHYSICAL PROPERTIES; RUTHENIUM ALLOYS; SPIN GLASS STATE; TEMPERATURE RANGE 0000-0013 K; TIN ALLOYS
- Descriptors DEC
- ALLOYS; MAGNETISM; PLATINUM METAL ALLOYS; RARE EARTH ALLOYS; RELAXATION; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.