Interaction of an Electromagnetic H Wave with a Thin Metal Film on a Dielectric Substrate in the Case of an Anisotropic Fermi Metal Surface

The interaction of an electromagnetic H wave with a thin metal film has been calculated with allowance for the ellipsoidal Fermi surface and constancy of the electron mean free path for different angles of incidence of the electromagnetic wave θ and different coefficients of specular reflection q₁ and q₂ at reflection of electrons from the film surfaces. The metal film is between two media with permittivities ε₁ and ε₂. The dependences of reflectance R, transmission T, and absorption A on the effective mass of conduction electrons have been analyzed.