Technique for electron beam spin polarization measurement and equipment for its realization

The invention is aimed at the increase in accuracy and fast-response of the device for the measurement of electron spin polarization. The measuring method is an electron beam is directed onto preliminarily purified surface of crystal-analyzer at the angle of THETA and then electrons, scattered at an angle of 2THETA, are recorded. The device, realizing the described measuring method, consists of an electron source, the first system of focusing lenses, monochromator, the second system of focusing lenses, crystal-analyzer and scattered electron collector, located in vacuum chamber in series. To increase the accuracy of measurement, crystal-analyzer with rigidly bound collector of scattered electrons is rotated as to two mutually perpendicular axes and according to the difference in the number of electrons, scattered in two mutually opposite directions, the corresponding projection of polarization vector is determined. High efficiency of the device is ensured at the expense of the preparation of pure surface of the crystal-analyzer by chipping in vacuum directly before measurement. The increase of accuracy of measurement can be achieved by the determination of all the three polarization vector components. It permits to restore completely polarization vector and it increases considerably informativity of the results obtained