Optimization of the quantitative direct solid total-reflection X-ray fluorescence analysis of glass microspheres functionalized with Zr organometallic compounds
- 1. Servicio Interdepartamental de Investigacion, Facultad de Ciencias, Universidad Autonoma de Madrid, Cantoblanco, E-28049, Madrid (Spain)
- 2. Departamento de Quimica Inorganica, Universidad de Alcala, Campus Universitario, 28871, Alcala de Henares, Madrid (Spain)
- 3. Instituto de Catalisis y Petroleo-Quimica, CSIC, Cantoblanco, 28049, Madrid (Spain)
Description
Quantitative determination of Zr in the system constituted by quartz microspheres functionalized with two kinds of organometallic compounds has been studied due to the importance of the correct quantization of the Zr from a catalytic point of view. Two parallel approximations were done, i.e. acid leaching and direct solid quantization. To validate the acid leaching TXRF measures, ICP-MS analysis were carried out. The results obtained by means of the optimization of the quantitative direct solid procedure show that, with a previous particle size distribution modification, TXRF obtain the same analytical results as ICP-MS and TXRF by acid leaching way but without previous chemical acid manipulation. This fact implies an important improvement for the analysis time, reagents costs and analysis facility and it proves again the versatility of TXRF to solve analytical problems in an easy, quick and accurate way. Additionally and for the direct solid TXRF measurements, a deeper study was done to evaluate the intrinsic analytical parameters of the Zr TXRF analysis of this material. So, the influence of the particle size distributions (modified by means of a high power ultrasound probe) with respect to uncertainty and detection limits for Zr were developed. The main analytical conclusion was the strong correlation between the average particle sizes and the TXRF analytical parameters of Zr measurements, i.e. concentration, accuracy, uncertainty and detection limits.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.sab.2010.02.006Additional details
Identifiers
- DOI
- 10.1016/j.sab.2010.02.006;
- PII
- S0584-8547(10)00037-6;
Publishing Information
- Journal Title
- Spectrochimica Acta. Part B, Atomic Spectroscopy
- Journal Volume
- 65
- Journal Issue
- 6
- Journal Page Range
- p. 450-456
- ISSN
- 0584-8547
- CODEN
- SAASBH
Conference
- Title
- 13. conference on total reflection X-ray fluorescence analysis and related methods
- Acronym
- TXRF 2009
- Dates
- 15-19 Jun 2009
- Place
- Goeteborg (Sweden)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42013518
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; ICP MASS SPECTROSCOPY; LEACHING; MICROSPHERES; OPTIMIZATION; ORGANOMETALLIC COMPOUNDS; PARTICLE SIZE; QUANTIZATION; REFLECTION; SENSITIVITY; X-RAY FLUORESCENCE ANALYSIS; ZIRCONIUM
- Descriptors DEC
- CHEMICAL ANALYSIS; DISSOLUTION; ELEMENTS; MASS SPECTROSCOPY; METALS; NONDESTRUCTIVE ANALYSIS; ORGANIC COMPOUNDS; SEPARATION PROCESSES; SIZE; SPECTROSCOPY; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.