Published January 1982
| Version v1
Journal article
Impact-ionization of excitons and application to gate-controlled bistable switching
Creators
- 1. Musashino Electrical Communication Lab., Tokyo (Japan)
Description
Exciton impact-ionization effects on low temperature photocurrent were investigated in Ge pin-MIS triodes. A simple model, taking into account the exciton impact-ionization process, was given to account for the observed anomalous temperature dependence and field dependence of the photocurrent on the device. The feasibility of the exciton impact-ionization due to the gate field was checked on the MIS-structure. On this device, gate-controlled bistable switching behaviour was expected to be obtained and was experimentally demonstrated. (author)
Additional details
Publishing Information
- Journal Title
- Jpn. J. Appl. Phys.
- Journal Volume
- 21
- Journal Issue
- suppl.21-1
- Series
- Jpn. J. Appl. Phys.
- Journal Page Range
- 389-394
- ISSN
- 0021-4922
Conference
- Title
- 13. conference on solid state devices.
- Dates
- 26-27 Aug 1981.
- Place
- Tokyo (Japan).
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 15004164
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL STRUCTURE; EXCITONS; GERMANIUM; IONIZATION; LOW TEMPERATURE; MIS TRANSISTORS; PHOTOELECTRIC EFFECT; SEMICONDUCTOR MATERIALS; SURFACES; SWITCHING DIODES; TEMPERATURE DEPENDENCE
- Descriptors DEC
- ELEMENTS; MATERIALS; METALS; QUASI PARTICLES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TRANSISTORS