Published January 1982 | Version v1
Journal article

Impact-ionization of excitons and application to gate-controlled bistable switching

  • 1. Musashino Electrical Communication Lab., Tokyo (Japan)

Description

Exciton impact-ionization effects on low temperature photocurrent were investigated in Ge pin-MIS triodes. A simple model, taking into account the exciton impact-ionization process, was given to account for the observed anomalous temperature dependence and field dependence of the photocurrent on the device. The feasibility of the exciton impact-ionization due to the gate field was checked on the MIS-structure. On this device, gate-controlled bistable switching behaviour was expected to be obtained and was experimentally demonstrated. (author)

Additional details

Publishing Information

Journal Title
Jpn. J. Appl. Phys.
Journal Volume
21
Journal Issue
suppl.21-1
Series
Jpn. J. Appl. Phys.
Journal Page Range
389-394
ISSN
0021-4922

Conference

Title
13. conference on solid state devices.
Dates
26-27 Aug 1981.
Place
Tokyo (Japan).