Published November 2010 | Version v1
Journal article

Surface metrology of x-ray optics for synchrotron radiation

  • 1. Japan Synchrotron Radiation Research Institute, Sayo, Hyogo (Japan)

Description

no abstract available

Availability note (English)

Available from http://dx.doi.org/10.2493/jjspe.76.1239

Additional details

Identifiers

Publishing Information

Journal Title
Seimitsu Kogaku Kaishi
Journal Volume
76
Journal Issue
11
Journal Page Range
p. 1239-1243
ISSN
0912-0289

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
42098892
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
ERRORS; FREE ELECTRON LASERS; MEASURING METHODS; MIRRORS; OPTICAL SYSTEMS; PERFORMANCE; SURFACE TREATMENTS; SYNCHROTRON RADIATION; X RADIATION; X-RAY LASERS
Descriptors DEC
BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LASERS; RADIATIONS

Optional Information

Notes
27 refs., 3 figs., 3 tabs.