Published November 2010
| Version v1
Journal article
Surface metrology of x-ray optics for synchrotron radiation
Description
no abstract available
Availability note (English)
Available from http://dx.doi.org/10.2493/jjspe.76.1239Additional details
Identifiers
Publishing Information
- Journal Title
- Seimitsu Kogaku Kaishi
- Journal Volume
- 76
- Journal Issue
- 11
- Journal Page Range
- p. 1239-1243
- ISSN
- 0912-0289
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 42098892
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- ERRORS; FREE ELECTRON LASERS; MEASURING METHODS; MIRRORS; OPTICAL SYSTEMS; PERFORMANCE; SURFACE TREATMENTS; SYNCHROTRON RADIATION; X RADIATION; X-RAY LASERS
- Descriptors DEC
- BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LASERS; RADIATIONS
Optional Information
- Notes
- 27 refs., 3 figs., 3 tabs.