Published 1995
| Version v1
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Contactless local quality control of semiconductor detector materials
Description
no abstract available
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Additional details
Additional titles
- Original title (Russian)
- Беcконтактный локальный контрол' качества полупроводниковых детекторных материалов
Publishing Information
- Imprint Place
- Jurmala (Latvia)
- Imprint Title
- 4. International Conference on Application of Semiconductor Detectors in Nuclear Physical Problems. Abstracts
- Imprint Pagination
- 138 p.
- Journal Page Range
- p. 132
- Report number
- INIS-LV--001
Conference
- Title
- 4. International Conference on Application of Semiconductor Detectors in Nuclear Physical Problems
- Dates
- 25-29 Sep 1995
- Place
- Jurmala (Latvia)
INIS
- Country of Publication
- Latvia
- Country of Input or Organization
- Latvia
- INIS RN
- 31065600
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- CARRIER LIFETIME; CHARGE CARRIERS; MICROWAVE RADIATION; PHOTOCONDUCTIVITY; QUALITY CONTROL; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS
- Descriptors DEC
- CONTROL; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; LIFETIME; MATERIALS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; RADIATION DETECTORS; RADIATIONS