Published September 2006 | Version v1
Journal article

Capillary wave fluctuations and intrinsic widths of coupled fluid-fluid interfaces: An x-ray scattering study of a wetting film on bulk liquid

  • 1. Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, New York 11973 (United States)
  • 2. Division of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138 (United States)
  • 3. Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973 (United States)
  • 4. Physics Department, Harvard University, Cambridge, Massachusetts 02138 (United States)

Description

An x-ray specular reflectivity (XR) and off-specular diffuse scattering (XDS) study of the coupled thermal capillary fluctuations and the intrinsic profiles of two interacting fluid-fluid interfaces is presented. The measurements are carried out on complete wetting films of perfluoromethylcyclohexane (PFMC) on the surface of bulk liquid eicosane (C20), as a function of film thickness 30 or approx. 50 A) is comparable to the value expected for the bulk liquid-liquid interface (D→∞), determined by either the radius of gyration (5.3 A) or the bulk correlation length (4.8 A) of the alkane C20. The intrinsic liquid-vapor interfacial width is sharper (∼2 A) and remains essentially constant over the entire probed range of D

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics
Journal Volume
74
Journal Issue
3
Journal Page Range
p. 031607-031607.19
ISSN
1063-651X
CODEN
PLEEE8

Optional Information

Notes
(c) 2006 The American Physical Society