The use of a scanning X-ray microprobe for simultaneous XRF/XRD studies of fly-ash particles
Creators
- 1. Chalmers Univ. of Technology/Goeteborg Univ. (Sweden)
- 2. ESRF, Grenoble Cedex (France)
- 3. Univ. of Antwerp, Antwerp (Belgium)
Description
With the opening of the first real 'third-generation' synchrotron source in Grenoble, in fall 1994, X-ray sources of unprecedented brilliances and qualities became available to the scientific community. Different X-ray analytical techniques could now be applied on a level that was unimaginable only a decade ago. Here are some preliminary results from an experiment where different analytical techniques have been applied on a micrometer level carried out at the most powerful synchrotron microbeam currently available in the world, the microfocus beamline (BL1) at ESRF. This beamline can now provide micrometer-sized X-ray beams with a flux density up to 1010 photons μm-2 at an energy of 13keV and with a bandwidth of 10-4. In this experiment, X-ray diffraction and X-ray fluorescence have been combined in order to obtain a precise and comprehensive micro-analytical description of micrometer-sized fly-ash particles. These types of particles are heavily inhomogeneous with a very irregular shape that makes them inaccessible to conventional micro-analysis. The experiment was performed in a scanning mode and two-dimensional images of different analytical information were reconstructed from the data recorded during the scan. The major features and limitations of this micro-analytical technique will be outlined and different examples on how the analytical information can be used for generating two-dimensional images of the sample will be demonstrated and discussed. (au) 15 refs
Additional details
Publishing Information
- Journal Title
- Journal of Synchrotron Radiation
- Journal Volume
- 4
- Journal Page Range
- p. 228-235.
- ISSN
- 0909-0495
- CODEN
- JSYRES
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 28070532
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- BEAM OPTICS; FLY ASH; IMAGES; MICROANALYSIS; PARTICULATES; PROBES; SYNCHROTRON RADIATION SOURCES; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- AEROSOL WASTES; ASHES; CHEMICAL ANALYSIS; COHERENT SCATTERING; COMBUSTION PRODUCTS; DIFFRACTION; NONDESTRUCTIVE ANALYSIS; PARTICLES; RADIATION SOURCES; SCATTERING; SOLID WASTES; WASTES; X-RAY EMISSION ANALYSIS