Deuterium depth profiles on coated lithium layer in EAST
Creators
- 1. SOKENDAI, Toki, 509-5292 Japan (Japan)
- 2. National Institute for Fusion Science, Toki, Gifu (Japan)
- 3. Institute of Plasma Physics Chinese Academy of Science, Hefei (China)
Description
Trapped deuterium (D) in coated lithium layers was investigated in EAST. Depth profiles of deuterium retention in lithium layers were analyzed using glow discharge optical emission spectroscopy. Thick lithium layer of 7.2 micron was coated on tungsten specimen at the high field side during one experimental campaign of EAST, and deuterium was trapped in the lithium layer until interface. Higher oxygen intensities were counted in the lithium layers and it suggested that lithium forms oxide. From one day sample exposure, D was observed on the surface layer only and D intensities were about one order of magnitude lower than that of long term exposure. Hence, higher D trapping in lithium layer was performed by long term plasma-lithium interactions. (author)
Files
50056659.pdf
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Additional details
Publishing Information
- Imprint Title
- Proceeding of A3 foresight program seminar on critical physics issues specific to steady state sustainment of high-performance plasmas 2017
- Imprint Pagination
- [245 p.]
- Journal Page Range
- p. 53-56
- Report number
- NIFS-PROC--111
Conference
- Title
- A3 foresight program seminar on critical physics issues specific to steady state sustainment of high-performance plasmas 2017 China
- Dates
- 12-15 Dec 2017
- Place
- Chongqing (China)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 50056659
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON; DEUTERIUM; FIRST WALL; GLOW DISCHARGES; HT-7U TOKAMAK; ION BEAMS; LITHIUM OXIDES; MASS NUMBER; PLASMA TECHNOLOGY; RETENTION; SCANNING ELECTRON MICROSCOPY; THERMONUCLEAR REACTOR MATERIALS; TUNGSTEN; VACUUM SYSTEMS; WALL EFFECTS
- Descriptors DEC
- ALKALI METAL COMPOUNDS; BEAMS; CHALCOGENIDES; CLOSED PLASMA DEVICES; ELECTRIC DISCHARGES; ELECTRON MICROSCOPY; ELEMENTS; HYDROGEN ISOTOPES; ISOTOPES; LIGHT NUCLEI; LITHIUM COMPOUNDS; MATERIALS; METALS; MICROSCOPY; NONMETALS; NUCLEI; ODD-ODD NUCLEI; OXIDES; OXYGEN COMPOUNDS; REFRACTORY METALS; STABLE ISOTOPES; THERMONUCLEAR DEVICES; THERMONUCLEAR REACTOR WALLS; TOKAMAK DEVICES; TRANSITION ELEMENTS
Optional Information
- Notes
- 4 refs., 3 figs.