Published April 15, 2006
| Version v1
Journal article
A combined experimental and analytical approach for interface fracture parameters of dissimilar materials in electronic packages
Creators
- 1. Department of Aerospace and Mechanical Engineering, University of Arizona, Tucson, AZ 85721-0119 (United States)
Description
This study concerns the development of a combined experimental and analytical technique to determine the critical values of fracture parameters for interfaces between dissimilar materials in electronic packages. This technique utilizes specimens from post-production electronic packages. The mechanical testing is performed inside a scanning electron microscope while the measurements are achieved by means of digital image correlation. The measured displacements around the crack tip are used as the boundary conditions for the analytical model to compute the energy release rate. The critical energy release rate values obtained from post-production package specimens are obtained to be lower than those laboratory specimens
Additional details
Identifiers
- DOI
- 10.1016/j.msea.2005.10.013;
- PII
- S0921-5093(05)01190-1;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 421
- Journal Issue
- 1-2
- Journal Page Range
- p. 57-67
- ISSN
- 0921-5093
- CODEN
- MSAPE3
Conference
- Title
- Internal stress and thermo-mechanical behavior in multi-component materials systems
- Acronym
- TMS annual meeting 2004
- Dates
- 14-18 Mar 2004
- Place
- Charlotte, NC (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38079009
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BOUNDARY CONDITIONS; CRACKS; FRACTURES; MATERIALS TESTING; MECHANICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY
- Descriptors DEC
- ELECTRON MICROSCOPY; FAILURES; MICROSCOPY; TESTING
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.