Published 1990
| Version v1
Book
Dc and ac Josephson effects in a granular material
- 1. Bonn Univ. (Germany). Inst. fuer Strahlen- und Kernphysik
Description
This paper reports on three-dimensional systems of point contacts that were prepared by pressing together Niobium grains of about 100 μm diameter inside a sapphire cylinder. Current-voltage characteristics were studied in dependence of temperature and, in addition, of the power of incident microwaves (X-bank). The results are similar to those established for a single weak link junction. Only for small currents the sample showed different behavior. The inverse a.c. Josephson effect was observed. The measured d.c. voltage shows and alternating temperature dependence which might be expected following the calculations of J.J. Chang for a weak link of small capacity and small resistance
Additional details
Publishing Information
- Publisher
- World Scientific Pub. Co.
- Imprint Place
- Teaneck, NJ (United States)
- ISBN
- 981-02-0211-3
- Imprint Title
- Transport properties of superconductors
- Imprint Pagination
- 790 p.
- Journal Page Range
- p. 397-403.
Conference
- Title
- international conference on transport properties of superconductors.
- Acronym
- ICTPS '90
- Dates
- 29 Apr - 4 May 1990.
- Place
- Rio de Janeiro (Brazil).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23056839
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CURRENT DENSITY; DIRECT CURRENT; ELECTRIC CONTACTS; ELECTRIC IMPEDANCE; JOSEPHSON EFFECT; JOSEPHSON JUNCTIONS; MATERIALS TESTING; MICROWAVE RADIATION; NIOBIUM; SAPPHIRE; SUPERCONDUCTING DEVICES; SUPERCONDUCTIVITY; TEMPERATURE DEPENDENCE; THREE-DIMENSIONAL CALCULATIONS; WEAK-COUPLING MODEL
- Descriptors DEC
- CORUNDUM; CURRENTS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELEMENTS; EQUIPMENT; IMPEDANCE; MATHEMATICAL MODELS; METALS; MINERALS; NUCLEAR MODELS; OXIDE MINERALS; PHYSICAL PROPERTIES; RADIATIONS; SEMICONDUCTOR JUNCTIONS; TESTING; TRANSITION ELEMENTS
Optional Information
- Secondary number(s)
- CONF-900411--.