Published March 31, 2006 | Version v1
Journal article

Muonium states and dynamics in 4H and 6H silicon carbide

  • 1. Department of Physics, Texas Tech University, Lubbock TX 79409-1051 (United States)
  • 2. Department of Physics, Istanbul University, Beyazit, 34459 Istanbul (Turkey)
  • 3. Department of Physics, University of Alberta, Edmonton AB, Canada TY6G 2J1 (Canada)
  • 4. ISIS, Rutherford Appleton Laboratory, Chilton, Oxfordshire OX11 0QX (United Kingdom): Condensed Matter and Materials Physics, University College London, WC1E 6BT (United Kingdom)

Description

Two isotropic Mu0 centers are found in 4H Silicon Carbide (SiC) and a total of four Mu0 states are seen in the 6H-SiC polytype. We report the temperature dependence of hyperfine constants, signal amplitudes, and relaxation rates for three Mu0 centers in p-type 6H-SiC from spin precession data at 6T. Low-field results for the diamagnetic fraction imply two ionization steps with energies of 0.21 and 0.88eV. Additional dynamics seen in several different SiC samples are discussed; however, specific assignments of site or charge-state transitions are not yet certain

Additional details

Identifiers

DOI
10.1016/j.physb.2005.11.103;
PII
S0921-4526(05)01321-9;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
374-375
Journal Page Range
p. 368-371
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
10. international conference on muon spin rotation, relaxation and resonance
Dates
8-12 Aug 2005
Place
Oxford (United Kingdom)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37073017
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AMPLITUDES; CHARGE STATES; ENERGY-LEVEL TRANSITIONS; HYDROGEN; IONIZATION; MAGNETIC FIELDS; MUON SPIN RELAXATION; MUONIUM; PRECESSION; SILICON CARBIDES; SPIN; TEMPERATURE DEPENDENCE
Descriptors DEC
ANGULAR MOMENTUM; CARBIDES; CARBON COMPOUNDS; ELEMENTS; NONMETALS; PARTICLE PROPERTIES; RELAXATION; SILICON COMPOUNDS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.