Published July 2, 2012
| Version v1
Journal article
Quantitative HAADF-STEM tomography of unsupported intermetallic Ga-Pd catalysts
Creators
- 1. Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ (United Kingdom)
- 2. Max-Planck-Institut für Chemische Physik fester Stoffe, Nöthnitzer Strasse 40, 01187 Dresden (Germany)
- 3. Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, 14195 Berlin (Germany)
Description
HAADF-STEM tomography has been used for characterisation of novel unsupported intermetallic Ga-Pd catalysts, with accompanying analysis by HRTEM and EDXS. Image processing techniques applied to the tomogram have facilitated segmentation and the subsequent extraction of size and shape parameters. The fidelity of the analysis has been critically examined, enabling identification of reconstruction artefacts and thereby more reliable determination of catalytically relevant properties. Further steps towards robust and accurate metrology by electron tomography are discussed.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/371/1/012024Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 371
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- Electron microscopy and analysis group conference 2011
- Acronym
- EMAG 2011
- Dates
- 6-9 Sep 2011
- Place
- Birmingham (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43104083
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CATALYSTS; GALLIUM; IMAGE PROCESSING; INTERMETALLIC COMPOUNDS; PALLADIUM; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALLOYS; DIAGNOSTIC TECHNIQUES; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; PLATINUM METALS; PROCESSING; SPECTROSCOPY; TRANSITION ELEMENTS