Published December 1989
| Version v1
Journal article
Transient radiation test techniques for high-speed analog-to-digital converters
Description
Extracting error data during transient radiation and heavy ion exposure of high-speed Analog-to-Digital Converters (ADC) presents unique radiation testing problems. The volume of data precludes simple test and analysis. Test techniques have been developed for both heavy ion and prompt gamma environments. Preliminary test data is shown to support validity of the test techniques
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 36
- Journal Issue
- 6
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 2356-2361
- ISSN
- 0018-9499
- CODEN
- IETNA
Conference
- Title
- 26. annual conference on nuclear and space radiation effects.
- Dates
- 25-29 Jul 1989.
- Place
- Marco Island, FL (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21054379
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S99: GENERAL AND MISCELLANEOUS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANALOG-TO-DIGITAL CONVERTERS; ENVIRONMENTAL IMPACTS; GAMMA RADIATION; HEAVY IONS; PERFORMANCE TESTING; RADIATION DOSES; RADIATION HARDENING
- Descriptors DEC
- CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; EQUIPMENT; HARDENING; IONIZING RADIATIONS; IONS; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; RADIATIONS; TESTING
Optional Information
- Secondary number(s)
- CONF-890723--.