Published March 2016 | Version v1
Journal article

A SHA-less 14-bit, 100-MS/s pipelined ADC with comparator offset cancellation in background

  • 1. State Key Laboratory of Wide Bandgap Semiconductor Technology Disciplines, School of Microelectronics, Xidian University, Xi'an 710071 (China)
  • 2. Department of Microelectronics, Xi'an Jiaotong University, Xi'an 710049 (China)

Description

A 14-bit 100-MS/s pipelined analog-to-digital converter (ADC) without dedicated front-end sample-and-hold amplifier (SHA) is presented. In addition to elaborate matching of the sampling network in the first stage, a background offset cancellation circuit is proposed in this paper to suppress the offset of the comparators in the first-stage sub-ADC, which ensures the overall offset does not exceed the correction range of the built-in redundant structure. Fabricated in a 0.18-μm CMOS technology, the presented ADC occupies a chip area of 12 mm2, and consumes 237 mW from a 1.8-V power supply. Measurement results with a 30.1-MHz input sine wave under a sampling rate of 100 MS/s show that the ADC achieves a 71-dB signal-to-noise and distortion ratio (SNDR), an 85.4-dB spurious-free dynamic range (SFDR), a maximum differential nonlinearity (DNL) of 0.22 LSB and a maximum integral nonlinearity (INL) of 1.4 LSB. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/37/3/035002

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
37
Journal Issue
3
Journal Page Range
[7 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47089204
Subject category
S97: MATHEMATICAL METHODS AND COMPUTING;
Descriptors DEI
AMPLIFIERS; ANALOG-TO-DIGITAL CONVERTERS; MHZ RANGE; NOISE; NONLINEAR PROBLEMS; PIPELINES; SIGNALS
Descriptors DEC
ELECTRONIC EQUIPMENT; EQUIPMENT; FREQUENCY RANGE