Investigation of ultrafast processes using X-ray free-electron laser radiation
Creators
Description
Free-electron laser (FEL) radiation using high energy electron accelerators will enable ultrafast time-resolved X-ray scattering for applications ranging from atomic physics, via plasma and solid-state physics to chemistry and structural biology. The high scientific potential of FELs operated in the self-amplified spontaneous emission (SASE) mode is determined by their radiation characteristics in the wavelength regime from 0.1 to 100 nm. Typically 1012-1013 photons are provided within a single pulse of the order 100 fs duration. The SASE process implies coherent emission and the coherence properties of hard X-ray FEL radiation therefore exceed those of existing X-ray sources by orders of magnitude. Time-resolved experiments using FEL radiation will in many cases allow data collection from single pulses. Statistical fluctuations lead to an enhanced requirement for diagnostics of intensity, spectral and temporal distributions
Additional details
Identifiers
- DOI
- 10.1016/j.chemphys.2003.12.013;
- PII
- S0301010403006906;
Publishing Information
- Journal Title
- Chemical Physics
- Journal Volume
- 299
- Journal Issue
- 2-3
- Journal Page Range
- p. 271-276
- ISSN
- 0301-0104
- CODEN
- CMPHC2
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38086989
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ACCELERATORS; ATOMIC PHYSICS; BIOLOGY; CHEMISTRY; ELECTRONS; EMISSION; FLUCTUATIONS; FREE ELECTRON LASERS; HARD X RADIATION; PHOTONS; PULSES; SOLID STATE PHYSICS; TIME RESOLUTION; WAVELENGTHS; X-RAY DIFFRACTION; X-RAY SOURCES
- Descriptors DEC
- BOSONS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; IONIZING RADIATIONS; LASERS; LEPTONS; MASSLESS PARTICLES; PHYSICS; RADIATION SOURCES; RADIATIONS; RESOLUTION; SCATTERING; TIMING PROPERTIES; VARIATIONS; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.