Published July 2009 | Version v1
Journal article

Electron relaxation and transport in nanostructured and bulk silica

  • 1. Physico-Technical Institute, Ural State Technical University, 19 Mira Street, 620002 Ekaterinburg (Russian Federation)
  • 2. Physics Department, University of Rostock, Universitatsplatz 3, D-18051 Rostock (Germany)

Description

Processes of ballistic and hot electron relaxation in extended bulk as well as nanostructured silica have been analyzed by means of a phonon-based scattering model and respective Monte-Carlo computer simulation. Optical as well as acoustic phonons are taken into account. Trajectories of electrons and their energy attenuation in nanostructured silica are additionally affected by scattering processes at the grain boundaries between the nanoparticles, i.e. by surface phonon as well as potential scattering. Moreover, a flatter conduction band and a higher effective electron mass have been taken into account too. According to these calculations, electrons with an initial energy of several eV, but still below the valence band ionization threshold, were thermalized in 50-300 fs increasing with the silica grain size from 1 nm up to bulk material. The electron emission probabilities over the surface barrier into vacuum are extended up to depths of 60-100 nm, respectively, increasing with enhancement by an electric field.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2009.04.012

Additional details

Identifiers

DOI
10.1016/j.elspec.2009.04.012;
PII
S0368-2048(09)00115-7;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
173
Journal Issue
2-3
Journal Page Range
p. 79-83
ISSN
0368-2048
CODEN
JESRAW

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.